D.C.U., Sivakumar and Gadde, Srinivasa Rao and K, Rosaiah and K, Kalyani (2023) Double Acceptance Sampling Plan for Odd Generalized Exponential Log-logistic Distribution Based on Truncated Life Test. Digital Manufacturing Technology. pp. 76-90. ISSN 2810-9309
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Abstract
According to the results of industrial research, product failure time is correlated with fatigue weakness, which is typically produced by repeated stress variations. A double acceptance sampling strategy was presented for shortened life tests where the lifespan of test products follows an odd generalized exponential log-logistic distribution (OGELLD), according to the findings of this study. The minimum sample sizes for the first and second samples are calculated using a producer’s risk of 0.05 to ensure that the actual median life is greater than the specified life at the chosen consumer confidence level. Based on various ratios of genuine median life to stipulated life, we analyzed operational features; we observed that reduced producer risk at the defined level was associated with the lowest median ratios to the specified level. Finally, an illustration is offered to help in the grasp of the suggested framework.
Item Type: | Article |
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Subjects: | AC Rearch Cluster |
Depositing User: | Unnamed user with email techsupport@mosys.org |
Date Deposited: | 13 Feb 2024 06:24 |
Last Modified: | 13 Feb 2024 06:24 |
URI: | https://ir.vignan.ac.in/id/eprint/754 |